Excess low-frequency noise in AlGaNÕGaN-based high-electron-mobility transistors

Effects of hydrostatic pressure and temperature on the AlGaN/GaN High electron mobility transistors

In this paper, drain-source current, transconductance and cutoff frequency in AlGaN/GaN high electron mobility transistors have been investigated. In order to obtain parameters of exact AlGaN/GaN high electron mobility transistors such as electron density, the wave function, band gap, polarization charge, effective mass and dielectric constant, the hydrostatic pressure and temperature effects a...

Microwave noise characterization of graphene field effect transistors

Articles you may be interested in Graphene based field effect transistor for the detection of ammonia Low frequency noise in GaN/AlGaN heterostructure field effect transistors in non-ohmic region Low-frequency noise and mobility fluctuations in AlGaN/GaN heterostructure field-effect transistors Appl.

Low-Frequency Noise in High-k LaLuO3/TiN MOSFETs

Low-frequency noise (LFN) characterization of high-k LaLuO3/TiN nMOS transistors is presented. The experimental results including the noise spectrum and normalized power noise density and mobility are reported. The noise results were successfully modeled to the correlated number and mobility fluctuation noise equation. High-k dielectric devices show lower mobility and roughly one to two orders ...

Localization of Off-Stress-Induced Damage in AlGaN/GaN High Electron Mobility Transistors by Means of Low Frequency 1/f Noise measurements

Device reliability study of high gate electric field effects in AlGaN/GaN high electron mobility transistors using low frequency noise spectroscopy

Low frequency noise characteristics of gate and drain currents are investigated for prestressed and poststressed AlGaN/GaN high electron mobility transistors. High reverse bias voltage stresses on the gate stack changes both drain and gate current noise. A temporary increase in drain current noise was observed during stress which recovered to prestress level a few weeks later. This is explained...